Switzerland : Zurich - Scanning electron microscopes
Powerful dual beam device consisting of focused ion beam (gallium) and field emission scanning electron microscope. Applicable for wide range in sample preparation and characterization in micro- and nanoscale (for details see specification documentation).
Legal, economic, financial and technical information
Partial offers are not permitted.
Conditions for countries not party to the WTO agreement: none.
Terms of business: General Terms and Conditions (GTC) of the domain of the federal institutes of technology for the purchase of goods, edition: September 2016, Status: September 2016.
Negotiations: remain reserved.
Basic procedural principles: the client only awards public commissions for services in Switzerland to tenderers who comply with job security regulations and the conditions of work for employees, and provide equal payment for men and women.
Additional information: the acquisition will be subject to the progress of the project and the availability of credits.
Procedures for appeal: pursuant to Art. 30 of the Federal Act on Public Procurement, an appeal against this publication may be filed within 20 days since notification in writing in an official language of Switzerland to the Federal Administrative Court, Postfach, 9023 St. Gallen. The appeal petition must be submitted in duplicate and must contain the application, the grounds of appeal with details of the evidence and the signature of the appellant or his agent; a copy of the present publication and documents cited as evidence must be attached, provided they are in the appellant’s possession.
Deadline/Remarks: 1x electronically as PDF file by email or by post on USB stick.
Remarks (desired deadline for questions in written form): Written questions will be accepted in the forum of www.simap.ch until the date stated. The questions will then be made anonymous and made available on www.simap.ch together with the corresponding answers.
National reference publication: SIMAP of 13.7.2019, doc. 1087371
Desired deadline for questions in written form: 9.8.2019.
22 Aug 20190 days remaining
Total estimated value
LOTS ASSOCIATED WITH THIS TENDER
CHE Not specifiedPowerful dual beam device consisting of focused ion beam (gallium) and field emission scanning electron microscope. Applicable for wide range in sample preparation and characterization in micro- and nanoscale (for details see specification documentation).
Main site or place of performanceETH Zürich, ScopeM, HPM A51.3, Otto-Stern-Weg 3, 8093 Zürich, SWITZERLAND.
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